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In-situ stress measurements in thin films using synchrotron diffraction

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/persons/resource/persons125273

Marx,  Vera Maria
Advanced Transmission Electron Microscopy, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Kirchlechner,  Christoph
Nano-/ Micromechanics of Materials, Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

/persons/resource/persons75388

Dehm,  Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Marx, V. M., Cordill, M. J., Kirchlechner, C., & Dehm, G. (2014). In-situ stress measurements in thin films using synchrotron diffraction. Talk presented at Summer School: Theory and Practice of Modern Powder Diffraction, Tagungshaus Schönenberg, Ellwangen. Ellwangen, Germany. 2014-10-05 - 2014-10-08.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0024-A2A2-F
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