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Cs+ ion source for secondary ion mass spectrometry

MPS-Authors

Bentz,  B. L.
Max Planck Society;

Weiß,  H.
Max Planck Society;

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Liebl,  H.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Fulltext (public)

IPP-9-37.pdf
(Any fulltext), 12MB

Supplementary Material (public)
There is no public supplementary material available
Citation

Bentz, B. L., Weiß, H., & Liebl, H.(1981). Cs+ ion source for secondary ion mass spectrometry (IPP 9/37). Garching: Max-Planck-Institut für Plasmaphysik.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0027-6A55-B
Abstract
There is no abstract available