Cs+ ion source for secondary ion mass spectrometry

Bentz, B. L.; Weiß, H.; Liebl, H.

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Cs+ ion source for secondary ion mass spectrometry

MPS-Authors

Bentz, B. L.
Max Planck Society;

Weiß, H.
Max Planck Society;

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Liebl, H.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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IPP-9-37.pdf
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Citation

Bentz, B. L., Weiß, H., & Liebl, H.(1981). Cs+ ion source for secondary ion mass spectrometry (IPP 9/37). Garching: Max-Planck-Institut für Plasmaphysik.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-6A55-B

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