A round robin characterisation of the thickness and composition of thin to 
ultra-thin AINO films

Barradas, N. P.; Added, N.; Arnoldbik, W. M.; Bogdanovic-Radovic, I.; Bohne, W.; Cardoso, S.; Danner, C.; Dytlewski, N.; Freitas, P. P.; Jaksic, M.; Jeynes, C.; Krug, C.; Lennard, W. N.; Lindner, S.; Linsmeier, Ch.; Medunic, Z.; Pelicon, P.; Pezzi, R. P.; Radtke, C.; Röhrich, J.; Sajavaara, T.; Salgado, T. D. M.; Stedile, F. C.; Tabacniks, M. H.; Vickridge, I.

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A round robin characterisation of the thickness and composition of thin to ultra-thin AINO films

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Danner, C.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Linsmeier, Ch.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Barradas, N. P., Added, N., Arnoldbik, W. M., Bogdanovic-Radovic, I., Bohne, W., Cardoso, S., et al. (2005). A round robin characterisation of the thickness and composition of thin to ultra-thin AINO films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 227, 397-419. Retrieved from http://dx.doi.org/10.1016/j.nimb.2004.08.021.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-1488-4

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