Time-of-flight mass-spectrometer for plasma analysis

Zalach, J.; Wiesemann, K.

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Time-of-flight mass-spectrometer for plasma analysis

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Zalach, J.
VINETA, Max Planck Institute for Plasma Physics, Max Planck Society;
Stellarator Scenario Development (E5), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Zalach, J., & Wiesemann, K. (2003). Time-of-flight mass-spectrometer for plasma analysis. In J. Meichsner, D. Loffhagen, & H.-E. Wagner (Eds.), 26th International Conference on Phenomena in Ionized Gases. Vol. 1 (pp. 187-188).

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-3C2F-9

Abstract

We describe a Time-of-Flight Mass-Spectrometer (TOF-MS) specially designed for plasma ion analysis at continously running discharges and for heavy ions. After an outline of the concept we present first results in the mass range 0 <m < 100 u.