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Journal Article

Deuterium Retention by Implantation in Carbide-Doped Graphites

MPS-Authors
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Balden,  M.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Oyarzabal,  E.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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De Juan Pardo,  E.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Roth,  J.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Balden, M., Oyarzabal, E., De Juan Pardo, E., Durocher, K., Roth, J., & Garcia-Rosales, C. (2003). Deuterium Retention by Implantation in Carbide-Doped Graphites. Physica Scripta, T103, 38-42. Retrieved from http://www.physica.org/asp/document.asp?article=t103p01a00038.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-3DFC-4
Abstract
For fine-grain graphites with different final heat treatment, the influences of the porosity, degree of graphitization, and dopant (TiC, VC, WC, and ZrC) on the fluence dependence of the retention of 1 keV deuterium were investigated using thermal desorption spectroscopy. A strong decrease of the D retention for fluences higher than 1021 D/m² was observed for the undoped graphites graphitized at temperatures above 2000 K compared to material only calcined at 1270 K. Due to the identical manufacturing processes for the carbide-doped graphites used in this study, the structure is comparable for all of them. The choice of dopant as well as the ratio of open to closed porosity show no influence on the D retention. Therefore, these properties of the graphites can be neglected for hydrogen retention estimations.