A novel method to determine the ion sputter coefficient of dilute segregating 
impurities

Viljoen, E.C.; Taglauer, E.; du Plessis, J.

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

A novel method to determine the ion sputter coefficient of dilute segregating impurities

MPS-Authors

/persons/resource/persons110618

Taglauer, E.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Viljoen, E., Taglauer, E., & du Plessis, J. (2001). A novel method to determine the ion sputter coefficient of dilute segregating impurities. Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms, 179, 515-520. Retrieved from http://www.sciencedirect.com/science/journal/0168583X.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-463B-B

Abstract

There is no abstract available