Characterization of nano-structured W-, Ti-, V-, and Zr-doped carbon films

Balden, M.

doi:10.1016/j.tsf.2010.11.058

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Characterization of nano-structured W-, Ti-, V-, and Zr-doped carbon films

MPS-Authors

/persons/resource/persons108606

Balden, M.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

Balden_Characterization.pdf
(Any fulltext), 3MB

Supplementary Material (public)

There is no public supplementary material available

Citation

Balden, M. (2011). Characterization of nano-structured W-, Ti-, V-, and Zr-doped carbon films. Thin Solid Films, 519(12), 4032-4036. doi:10.1016/j.tsf.2010.11.058.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0026-E94C-7

Abstract

There is no abstract available