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High resolution scanning transmission electron microscopy (HR STEM) analysis of re-deposited layer on ASDEX Upgrade tile

MPS-Authors
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Rasinski,  M.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Mayer,  M.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Neu,  R.
Tokamak Edge and Divertor Physics (E2), Max Planck Institute for Plasma Physics, Max Planck Society;
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Rasinski, M., Fortuna-Zalesna, E., Mayer, M., Neu, R., Plocinski, T., Lewandowska, M., et al. (2011). High resolution scanning transmission electron microscopy (HR STEM) analysis of re-deposited layer on ASDEX Upgrade tile. Fusion Engineering and Design, 86(9-11), 1753-1756. doi:10.1016/j.fusengdes.2011.02.085.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0026-ECF1-A
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