Quantitative depth profiling of deuterium up to very large depths

Mayer, M.; Gauthier, E.; Sugiyama, K.; von Toussaint, U.

doi:10.1016/j.nimb.2008.11.033

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Quantitative depth profiling of deuterium up to very large depths

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Mayer, M.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Sugiyama, K.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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von Toussaint, U.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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引用

Mayer, M., Gauthier, E., Sugiyama, K., & von Toussaint, U. (2009). Quantitative depth profiling of deuterium up to very large depths. Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms, 267(3), 506-512. doi:10.1016/j.nimb.2008.11.033.

引用: https://hdl.handle.net/11858/00-001M-0000-0026-F410-1

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