Effect of gas injection during LH wave coupling at ITER-relevant plasma-wall 
distances in JET

Ekedahl, A.; Rantamäki, K.; Goniche, M.; Mailloux, J.; Petrzilka, V.; Alper, B.; Baranov, Y.; Basiuk, V.; Beaumont, P.; Corrigan, G.; Delpech, L.; Erents, K.; Granucci, G.; Hawkes, N.; Hobirk, J.; Imbeaux, F.; Joffrin, E.; Kirov, K.; Loarer, T.; McDonald, D.; Nave, M. F. F.; Nunes, I.; Ongena, J.; Parail, V.; Piccolo, F.; Rachlew, E.; Silva, C.; Sirinelli, A.; Stamp, M.; Zastrow, K.-D.; JET-EFDA Contributors

doi:10.1088/0741-3335/51/4/044001

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Effect of gas injection during LH wave coupling at ITER-relevant plasma-wall distances in JET

MPS-Authors

/persons/resource/persons109400

Hobirk, J.
Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons109607

Kirov, K.
Tokamak: Edge and Divertor Physics (E2), Max Planck Institute for Plasma Physics, Max Planck Society;
Experimental Plasma Physics 2 (E2), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110109

Parail, V.
Tokamak Theory (TOK), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110868

Zastrow, K.-D.
Experimental Plasma Physics 4 (E4), Max Planck Institute for Plasma Physics, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

link_fulltext.htm
(Any fulltext), 4KB

Supplementary Material (public)

There is no public supplementary material available

Citation

Ekedahl, A., Rantamäki, K., Goniche, M., Mailloux, J., Petrzilka, V., Alper, B., et al. (2009). Effect of gas injection during LH wave coupling at ITER-relevant plasma-wall distances in JET. Plasma Physics and Controlled Fusion, 51: 044001 (17pp). doi:10.1088/0741-3335/51/4/044001.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0026-F598-B

Abstract

There is no abstract available