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Journal Article

Thermal induced structural changes of a-C and a-C:Ti films analyzed by NEXAFS and XPS

MPS-Authors
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Adelhelm,  C.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Balden,  M.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Kost,  F.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Herrmann,  A.
Tokamak Scenario Development (E1), Max Planck Institute for Plasma Physics, Max Planck Society;

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Lindig,  S.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Adelhelm, C., Balden, M., Kost, F., Herrmann, A., & Lindig, S. (2008). Thermal induced structural changes of a-C and a-C:Ti films analyzed by NEXAFS and XPS. Journal of Physics: Conference Series, 100(6): 062033 (4pp). doi:10.1088/1742-6596/100/6/062033.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0026-FE2D-2
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