Tritium retention in next step devices and the requirements for mitigation and 
removal techniques. Invited paper

Counsell, G.; Coad, P.; Grisolia, C.; Hopf, C.; Jacob, W.; Kirschner, A.; Kreter, A.; Krieger, K.; Likonen, J.; Philipps, V.; Roth, J.; Rubel, M.; Salancon, E.; Semerok, A.; Tabares, F.; Widdowson, A.; JET-EFDA Contributors

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Tritium retention in next step devices and the requirements for mitigation and removal techniques. Invited paper

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Hopf, C.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;
Experimental Plasma Physics 4 (E4), Max Planck Institute for Plasma Physics, Max Planck Society;

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Jacob, W.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Krieger, K.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Roth, J.
Material Research (MF), Max Planck Institute for Plasma Physics, Max Planck Society;

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Counsell, G., Coad, P., Grisolia, C., Hopf, C., Jacob, W., Kirschner, A., et al. (2006). Tritium retention in next step devices and the requirements for mitigation and removal techniques. Invited paper. Plasma Physics and Controlled Fusion, 48, B189-B199. Retrieved from http://www.iop.org/EJ/abstract/0741-3335/48/12B/S18.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-0F6E-B

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