Deuterium retention in tungsten-doped amorphous carbon films exposed to 
deuterium plasma

Wang, P.; Jacob, W.; Gao, L.; Dürbeck, T.

doi:10.1016/j.jnucmat.2013.01.250

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Deuterium retention in tungsten-doped amorphous carbon films exposed to deuterium plasma

MPS-Authors

/persons/resource/persons110733

Wang, P.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons109489

Jacob, W.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons109138

Gao, L.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons108981

Dürbeck, T.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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http://dx.doi.org/10.1016/j.jnucmat.2013.01.250
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Citation

Wang, P., Jacob, W., Gao, L., & Dürbeck, T. (2013). Deuterium retention in tungsten-doped amorphous carbon films exposed to deuterium plasma. Journal of Nuclear Materials, 438, S1134-S1137. doi:10.1016/j.jnucmat.2013.01.250.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0026-DCE4-7

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