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Journal Article

Rutherford backscattering analysis of porous thin TiO2 films

MPS-Authors
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Mayer,  M.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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von Toussaint,  U.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Mayer, M., von Toussaint, U., Dewalque, J., Dubreuil, O., Henrist, C., Cloots, R., et al. (2012). Rutherford backscattering analysis of porous thin TiO2 films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 273, 83-87. doi:10.1016/j.nimb.2011.07.045.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0026-E4F3-2
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