Rutherford backscattering analysis of porous thin TiO2 films

Mayer, M.; von Toussaint, U.; Dewalque, J.; Dubreuil, O.; Henrist, C.; Cloots, R.; Mathis, F.

doi:10.1016/j.nimb.2011.07.045

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Rutherford backscattering analysis of porous thin TiO₂ films

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Mayer, M.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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von Toussaint, U.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Mayer, M., von Toussaint, U., Dewalque, J., Dubreuil, O., Henrist, C., Cloots, R., et al. (2012). Rutherford backscattering analysis of porous thin TiO₂ films. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 273, 83-87. doi:10.1016/j.nimb.2011.07.045.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0026-E4F3-2

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