Statistically sound evaluation of trace element depth profiles by ion beam 
analysis

Schmid, K.; von Toussaint, U.

doi:10.1016/j.nimb.2012.03.024

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Statistically sound evaluation of trace element depth profiles by ion beam analysis

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Schmid, K.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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von Toussaint, U.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Schmid, K., & von Toussaint, U. (2012). Statistically sound evaluation of trace element depth profiles by ion beam analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 281, 64-71. doi:10.1016/j.nimb.2012.03.024.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0026-E571-F

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