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Journal Article

Depth profile determination with confidence intervals from Rutherford backscattering data

MPS-Authors
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von Toussaint,  U.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Fischer,  R.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Krieger,  K.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Dose,  V.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Toussaint.pdf
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Citation

von Toussaint, U., Fischer, R., Krieger, K., & Dose, V. (1999). Depth profile determination with confidence intervals from Rutherford backscattering data. New Journal of Physics, 1: 11. Retrieved from http://www.iop.org/EJ/abstract/1367-2630/1/1/311.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-848C-5
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