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High-performance x-ray detector for appearance potential spectroscopy

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Rangelov,  G.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Ertl,  K.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Vonbank,  M.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

Bassen,  S.
Max Planck Society;

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Reinmuth,  J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Donath,  M.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Dose,  V.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Rangelov, G., Ertl, K., Passek, F., Vonbank, M., Bassen, S., Reinmuth, J., et al. (1998). High-performance x-ray detector for appearance potential spectroscopy. Journal of Vacuum Science & Technology A: Vacuum Surfaces and Films, 16(4), 2738-2741. doi:10.1116/1.581416.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0027-8837-1
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