Ion beam analysis of oxidised a-C:D layers on Be - A comparison of 4He RBS and 
28Si ERD analysis

Roth, J.; Walsh, D. S.; Wampler, W. R.; Mayer, M.

doi:10.1016/S0168-583X(97)00774-X

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Ion beam analysis of oxidised a-C:D layers on Be - A comparison of ⁴He RBS and ²⁸Si ERD analysis

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Roth, J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Mayer, M.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Roth, J., Walsh, D. S., Wampler, W. R., & Mayer, M. (1998). Ion beam analysis of oxidised a-C:D layers on Be - A comparison of ⁴He RBS and ²⁸Si ERD analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 136-138, 689-694. doi:10.1016/S0168-583X(97)00774-X.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-88A4-B

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