Ion beam analysis of oxidised a-C:D layers on Be - A comparison of 4He RBS and 
28Si ERD analysis

Roth, J.; Walsh, D. S.; Wampler, W. R.; Mayer, M.

doi:10.1016/S0168-583X(97)00774-X

アイテム詳細

登録内容を編集ファイル形式で保存

一時保存へ追加

タグ情報を表示リリース履歴を表示詳細要約

公開

学術論文

Ion beam analysis of oxidised a-C:D layers on Be - A comparison of ⁴He RBS and ²⁸Si ERD analysis

MPS-Authors

/persons/resource/persons110287

Roth, J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons109910

Mayer, M.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

External Resource

There are no locators available

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

フルテキスト (公開)

公開されているフルテキストはありません

付随資料 (公開)

There is no public supplementary material available

引用

Roth, J., Walsh, D. S., Wampler, W. R., & Mayer, M. (1998). Ion beam analysis of oxidised a-C:D layers on Be - A comparison of ⁴He RBS and ²⁸Si ERD analysis. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 136-138, 689-694. doi:10.1016/S0168-583X(97)00774-X.

引用: https://hdl.handle.net/11858/00-001M-0000-0027-88A4-B

要旨

要旨はありません