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Bayesian techniques and the principle of maximum entropy in ion-beam analysis applications

MPS-Authors
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Fischer,  R.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Linden,  W. von der
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Dose,  V.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Prozesky, V. M., Padayachee, J., Fischer, R., Linden, W. v. d., Dose, V., & Weller, R. A. (1998). Bayesian techniques and the principle of maximum entropy in ion-beam analysis applications. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 136-138, 1146-1151. doi:10.1016/S0168-583X(97)00806-9.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0027-88A9-1
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