Characterization of the temperature dependent phase transition of evaporated Ti 
films on diamond: Phase identification using maximum entropy data analysis

Miller, S.; Fischer, R.; Plank, H.; Roth, J.; Dose, V.

doi:10.1063/1.365640

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Characterization of the temperature dependent phase transition of evaporated Ti films on diamond: Phase identification using maximum entropy data analysis

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Miller, S.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Fischer, R.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Plank, H.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Roth, J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Dose, V.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Miller, S., Fischer, R., Plank, H., Roth, J., & Dose, V. (1997). Characterization of the temperature dependent phase transition of evaporated Ti films on diamond: Phase identification using maximum entropy data analysis. Journal of Applied Physics, 82, 3314-3320. doi:10.1063/1.365640.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-898D-A

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