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The use of maximum entropy and Bayesian statistics in ion-beam applications

MPS-Authors
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Fischer,  R.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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von der Linden,  W.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Dose,  V.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Prozesky, V. M., Padayachee, J., Fischer, R., von der Linden, W., Dose, V., & Ryan, C. G. (1997). The use of maximum entropy and Bayesian statistics in ion-beam applications. In J. Duggan, & I. Morgan (Eds.), Application of Accelerators in Research and Industry. Proceedings of the Fourteenth International Conference (pp. 595-598). Woodbury,NY: American Institute of Physics.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0027-8992-9
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