X-ray photoelectron spectroscopy study of TiC films grown by annealing thin Ti 
films on graphite

Miller, S.; Berning, G. L. P.; Plank, H.; Roth, J.

doi:10.1116/1.580675

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

X-ray photoelectron spectroscopy study of TiC films grown by annealing thin Ti films on graphite

MPS-Authors

/persons/resource/persons109964

Miller, S.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110173

Plank, H.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

/persons/resource/persons110287

Roth, J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Miller, S., Berning, G. L. P., Plank, H., & Roth, J. (1997). X-ray photoelectron spectroscopy study of TiC films grown by annealing thin Ti films on graphite. Journal of Vacuum Science and Technology A, 15(4), 2029-2034. doi:10.1116/1.580675.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-89CB-B

Abstract

There is no abstract available