Amplitude modulation reflectometry for density profile measurements

Zhuravlev, V.; Sanchez, J.; delaLuna, E.; Hirsch, M.; Estrada, T.; Branas, B.; Frances, M.; Geist, T.; Hartfuss, H. J.; Hanson, G. R.; Wilgen, J. B.; Kaita, R.

doi:10.1016/S0920-3796(96)00605-9

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Amplitude modulation reflectometry for density profile measurements

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Hirsch, M.
Experimental Plasma Physics 3 (E3), Max Planck Institute for Plasma Physics, Max Planck Society;

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Geist, T.
Experimental Plasma Physics 3 (E3), Max Planck Institute for Plasma Physics, Max Planck Society;

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Hartfuss, H. J.
Experimental Plasma Physics 3 (E3), Max Planck Institute for Plasma Physics, Max Planck Society;

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Zhuravlev, V., Sanchez, J., delaLuna, E., Hirsch, M., Estrada, T., Branas, B., et al. (1997). Amplitude modulation reflectometry for density profile measurements. Fusion Engineering and Design, 421-424. doi:10.1016/S0920-3796(96)00605-9.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-8A27-6

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