Tritium depth profiling in carbon by accelerator mass spectrometry

Friedrich, M.; Sun, G.; Grotschel, R.; Behrisch, R.; GarciaRosales, C.; Roberts, M. L.

doi:10.1016/S0168-583X(96)00404-1

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

Tritium depth profiling in carbon by accelerator mass spectrometry

MPS-Authors

/persons/resource/persons108660

Behrisch, R.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

GarciaRosales, C.
Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Friedrich, M., Sun, G., Grotschel, R., Behrisch, R., GarciaRosales, C., & Roberts, M. L. (1997). Tritium depth profiling in carbon by accelerator mass spectrometry. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 123(1-4), 410-413. doi:10.1016/S0168-583X(96)00404-1.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-8A45-2

Abstract

There is no abstract available