Ion scattering and scanning tunneling microscopy studies of stepped Cu surfaces

Taglauer, E.; Reiter, S.; Liegl, A.; Schömann, S.

doi:10.1016/0168-583X(95)01099-8

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Ion scattering and scanning tunneling microscopy studies of stepped Cu surfaces

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Taglauer, E.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Reiter, S.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

Liegl, A.
Max Planck Society;

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Taglauer, E., Reiter, S., Liegl, A., & Schömann, S. (1996). Ion scattering and scanning tunneling microscopy studies of stepped Cu surfaces. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 118(1-4), 456-461. doi:10.1016/0168-583X(95)01099-8.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-8CF2-C

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