HREEL spectroscopy of thin ion beam deposited C:H(D) films

Biener, J.; Schenk, A.; Winter, B.; Küppers, J.

doi:10.1016/0368-2048(93)80095-4

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HREEL spectroscopy of thin ion beam deposited C:H(D) films

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Biener, J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Schenk, A.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Winter, B.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Küppers, J.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Biener, J., Schenk, A., Winter, B., & Küppers, J. (1993). HREEL spectroscopy of thin ion beam deposited C:H(D) films. Journal of Electron Spectroscopy and Related Phenomena, 331-339. doi:10.1016/0368-2048(93)80095-4.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-91DC-A

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