Help Privacy Policy Disclaimer
  Advanced SearchBrowse




Journal Article

Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction


Herzog,  Marc
Institut für Physik und Astronomie, Universität Potsdam;
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

External Resource
No external resources are shared
Fulltext (restricted access)
There are currently no full texts shared for your IP range.
Fulltext (public)

(Publisher version), 2MB

Supplementary Material (public)
There is no public supplementary material available

Schick, D., Herzog, M., Bojahr, A., Leitenberger, W., Hertwig, A., Shayduk, R., et al. (2014). Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction. Structural Dynamics, 1(6): 064501. doi:10.1063/1.4901228.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-9E45-5
Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain propagation for acoustic impedance-matched opaque films on a semi-infinite transparent substrate, showing that the lattice dynamics essentially depend on two parameters: One for the spatial profile and one for the amplitude of the strain. We illustrate the results by comparison with high-quality ultrafast X-ray diffraction data of SrRuO3 films on SrTiO3 substrates.