Resolution of patch capacitance recordings and of fusion pore conductances in 
small vesicles

Debus, Knut; Lindau, Manfred

doi:10.1016/S0006-3495(00)76837-8

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Resolution of patch capacitance recordings and of fusion pore conductances in small vesicles

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Debus, Knut
Department of Molecular Cell Research, Max Planck Institute for Medical Research, Max Planck Society;

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Lindau, Manfred
Department of Molecular Cell Research, Max Planck Institute for Medical Research, Max Planck Society;

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Citation

Debus, K., & Lindau, M. (2000). Resolution of patch capacitance recordings and of fusion pore conductances in small vesicles. Biophysical Journal (Annual Meeting Abstracts), 78(6), 2983-2997. doi:10.1016/S0006-3495(00)76837-8.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-A4B2-9

Abstract

We investigated the noise levels in cell-attached patch capacitance recordings with a lock-in amplifier. The capacitance noise level decreases with increasing sine wave frequency up to 20-40 kHz. With a 20-mV rms sine wave the rms noise level above 8 kHz is <50 aF. With increasing sine wave amplitudes a further reduction down to 14 aF could be achieved. Capacitance measurements with a lock-in amplifier may also be used to measure the conductance of fusion pores connecting the vesicular lumen to the extracellular space. It is estimated that at noise levels of 14 aF fusion pore conductances between 20 pS and 700 pS may be resolved in vesicles with 380-aF capacitance by using a 50-kHz sine wave. This corresponds to vesicles with a approximately 110-nm diameter. It is suggested that with low-noise techniques fusion pores may be detectable in vesicles approaching the size of large synaptic vesicles.