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Transient effects during erosion of WN and FeW films by deuterium ions studied with the quartz crystal microbalance technique

MPS-Authors
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Meisl,  G.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Sugiyama,  K.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Oberkofler,  M.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Schwarz-Selinger,  T.
Plasma Edge and Wall (E2M), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Aumayr, F., Berger, B. M., Stadlmayr, R., Meisl, G., Čekada, M., Sugiyama, K., et al. (2015). Transient effects during erosion of WN and FeW films by deuterium ions studied with the quartz crystal microbalance technique. Poster presented at 15th International Conference on Plasma-Facing Materials and Components for Fusion Applications (PFMC-15), Aix-en-Provence.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-B452-9
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