Local Characterization of Ultrathin ZnO Layers on Ag(111) by STM and AFM

Kumagai, Takashi

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Talk

Local Characterization of Ultrathin ZnO Layers on Ag(111) by STM and AFM

MPS-Authors

/persons/resource/persons32784

Kumagai, Takashi
Physical Chemistry, Fritz Haber Institute, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Kumagai, T. (2015). Local Characterization of Ultrathin ZnO Layers on Ag(111) by STM and AFM. Talk presented at Colloquium of the Collaborative Research Centre 951 “Hybrid Inorganic/Organic Systems for Opto-Electronics” (HIOS). Berlin, Germany. 2015-04-16.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-BA19-0

Abstract

There is no abstract available