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Oxygen reduction and water at the semiconductor/solution interface probed by stationary and time-resolved ATR-IR spectroscopy coupled to electrochemical experiments and DFT calculations

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Pengel,  Stefanie
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Niu,  Fang
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Nayak,  Simantini
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Tecklenburg,  Stefanie
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Chen,  Ying-Hsuan
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Ebbinghaus,  Petra
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Yang,  Lei
Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Biedermann,  Paul Ulrich
Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Wippermann,  Stefan Martin
Atomistic Modelling, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Erbe,  Andreas
Interface Spectroscopy, Interface Chemistry and Surface Engineering, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Pengel, S., Niu, F., Nayak, S., Tecklenburg, S., Chen, Y.-H., Ebbinghaus, P., et al. (2015). Oxygen reduction and water at the semiconductor/solution interface probed by stationary and time-resolved ATR-IR spectroscopy coupled to electrochemical experiments and DFT calculations. In B. Lendl, C. Koch, M. Kraft, J. Ofner, & G. Ramer (Eds.), Program of the 8th International Conference on Advanced Vibrational Spectroscopy (ICAVS) – Oral Abstracts (pp. 130-131).


Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-CFA4-B
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