Application of Ambient-Pressure X-ray Photoelectron Spectroscopy for the 
In-situ Investigation of Heterogeneous Catalytic Reactions

Starr, David E.; Bluhm, Hendrik; Liu, Zhi; Knop-Gericke, Axel; Hävecker, Michael

doi:10.1002/9781118355923.ch12

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Application of Ambient-Pressure X-ray Photoelectron Spectroscopy for the In-situ Investigation of Heterogeneous Catalytic Reactions

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Knop-Gericke, Axel
Inorganic Chemistry, Fritz Haber Institute, Max Planck Society;

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Citation

Starr, D. E., Bluhm, H., Liu, Z., Knop-Gericke, A., & Hävecker, M. (2013). Application of Ambient-Pressure X-ray Photoelectron Spectroscopy for the In-situ Investigation of Heterogeneous Catalytic Reactions. In J. A. Rodriguez, J. C. Hanson, & P. J. Chupas (Eds.), In-situ Characterization of Heterogeneous Catalysts (pp. 315-343). Weinheim: Wiley-VCH. doi:10.1002/9781118355923.ch12.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0027-D2D8-F

Abstract

The desire to carry out X-ray photoelectron spectroscopy (XPS) measurements at elevated pressure conditions has existed for decades and numerous research groups have contributed to the development of a modern form of XPS that can be used at gas pressures up to about 7 mbar. This technique is currently known as ambient-pressure (AP) XPS. This chapter provides an overview of the historical development of AP-XPS addressing specific technical advances and their relevance. It provides examples of the application of AP-XPS. These examples demonstrate the versatility of this technique for the investigation of catalytically relevant systems ranging from structurally well-defined systems composed of adsorbates on single crystal surfaces and nanoparticles, the catalytic growth of nanotubes, to operating electrochemical cells and industrial heterogeneous catalysts.