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Electron microscopy investigation of solid state dewetted epitaxial Al thin films on sapphire

MPS-Authors
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Hieke,  Stefan Werner
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Dehm,  Gerhard
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Hieke, S. W., Dehm, G., & Scheu, C. (2015). Electron microscopy investigation of solid state dewetted epitaxial Al thin films on sapphire. Poster presented at International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices (IAMNano 2015), Hamburg, Germany.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0028-1368-B
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