Ellipsometric study of silicon nanocrystal optical constants

Amans, D.; Callard, S.; Gagnaire, A.; Joseph, J.; Ledoux, G.; Huisken, F.

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Ellipsometric study of silicon nanocrystal optical constants

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Huisken, F.
Max Planck Institute for Dynamics and Self-Organization, Max Planck Society;

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Amans, D., Callard, S., Gagnaire, A., Joseph, J., Ledoux, G., & Huisken, F. (2003). Ellipsometric study of silicon nanocrystal optical constants. Journal of Applied Physics, 93(7), 4173-4179.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0029-16EF-7

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