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Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films

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Schwarz,  Torsten
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Choi,  Pyuck-Pa
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Cojocaru-Mirédin,  Oana
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Schwarz, T., Choi, P.-P., Cojocaru-Mirédin, O., Mousel, M., Redinger, A., Siebentritt, S., et al. (2015). Atom probe tomography study of internal interfaces in Cu2ZnSnSe4 thin-films. Talk presented at E-MRS Spring Meeting 2015. Lille, France. 2015-05-11 - 2015-05-15.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0028-344D-3
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