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On the nano-scale characterization of kesterite thin-films

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Schwarz,  Torsten
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Choi,  Pyuck-Pa
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Cojocaru-Mirédin,  Oana
Atom Probe Tomography, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Schwarz, T., Choi, P.-P., Cojocaru-Mirédin, O., Mousel, M., Redinger, A., Siebentritt, S., et al. (2014). On the nano-scale characterization of kesterite thin-films. Talk presented at Seminar „Neue Materialien - Halbleiter“ 2014, Otto-von-Guericke University. Magdeburg, Germany. 2014.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-345C-1
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