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Characterization of Mo2BC thin films by transmission electron microscopy methods

MPS-Authors
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Gleich,  Stephan
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Djaziri,  Soundès
Structure and Nano-/ Micromechanics of Materials, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Scheu,  Christina
Nanoanalytics and Interfaces, Independent Max Planck Research Groups, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Citation

Gleich, S., Djaziri, S., Bolvardi, H., Schneider, J. M., & Scheu, C. (2015). Characterization of Mo2BC thin films by transmission electron microscopy methods. Poster presented at 2nd International Workshop on TEM Spectroscopy, Uppsala, Sweden.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0023-C731-3
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