CHARACTERIZATION OF RECAST NAFION FILMS BY SMALL- AND WIDE-ANGLE 
X-RAY-SCATTERING

Halim, J.; Scherer, G. G.; Stamm, Manfred

doi:10.1002/macp.1994.021951204

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CHARACTERIZATION OF RECAST NAFION FILMS BY SMALL- AND WIDE-ANGLE X-RAY-SCATTERING

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Stamm, Manfred
MPI for Polymer Research, Max Planck Society;

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Halim, J., Scherer, G. G., & Stamm, M. (1994). CHARACTERIZATION OF RECAST NAFION FILMS BY SMALL- AND WIDE-ANGLE X-RAY-SCATTERING. Macromolecular Chemistry and Physics, 195(12), 3783-3788. doi:10.1002/macp.1994.021951204.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-3BE9-D

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