Measuring surface dislocation nucleation in defect-scarce nanostructures

Chen, Lisa Y.; He, Mo-rigen; Shin, Jungho; Richter, Gunther; Gianola, Daniel S.

doi:10.1038/nmat4288

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Measuring surface dislocation nucleation in defect-scarce nanostructures

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Richter, Gunther
Dept. Physical Intelligence, Max Planck Institute for Intelligent Systems, Max Planck Society;

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Chen, L. Y., He, M.-r., Shin, J., Richter, G., & Gianola, D. S. (2015). Measuring surface dislocation nucleation in defect-scarce nanostructures. Nature Materials, 14, 707-713. doi:10.1038/nmat4288.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-46C2-A

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