SEM and TEM based orientation microscopy for investigation of recrystallization 
processes

Zaefferer, Stefan

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SEM and TEM based orientation microscopy for investigation of recrystallization processes

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Zaefferer, Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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引用

Zaefferer, S. (2014). SEM and TEM based orientation microscopy for investigation of recrystallization processes. Talk presented at CNRS summer school on recrystallization. Frejus, France. 2014-09-09.

引用: https://hdl.handle.net/11858/00-001M-0000-0028-45BC-2

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