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Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by scanning electron microscopy-based diffraction techniques

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Zaefferer,  Stefan
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Ram,  Farangis
Microscopy and Diffraction, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Mandal,  Suvendu
Theory and Simulation of Complex Fluids, Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Raabe,  Dierk
Microstructure Physics and Alloy Design, Max-Planck-Institut für Eisenforschung GmbH, Max Planck Society;

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Zaefferer, S., Ram, F., Mandal, S., & Raabe, D. (2015). Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by scanning electron microscopy-based diffraction techniques. Talk presented at ICOTOM 17; invited plenary. Dresden, Germany. 2015-08-24 - 2015-08-29.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0028-45CE-9
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