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Fixed target matrix for femtosecond time-resolved and in situ serial micro-crystallography

MPS-Authors
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Marx,  Alexander
Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;

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Epp,  Sascha W.
Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;

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Zhong,  Yin Peng
Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;

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Miller,  R. J. Dwayne
Departments of Chemistry and Physics, University of Toronto, 80 St. George Street, Toronto, Ontario M5S 3H6, Canada;
Miller Group, Atomically Resolved Dynamics Department, Max Planck Institute for the Structure and Dynamics of Matter, Max Planck Society;
Hamburg Centre for Ultrafast Imaging, University of Hamburg, CFEL, Building 99, Luruper Chaussee 149, 22761 Hamburg, Germany;

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1.4928706.pdf
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Citation

Mueller, C., Marx, A., Epp, S. W., Zhong, Y. P., Kuo, A., Balo, A. R., et al. (2015). Fixed target matrix for femtosecond time-resolved and in situ serial micro-crystallography. Structural Dynamics, 2(5): 054302. doi:10.1063/1.4928706.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0028-4E67-5
Abstract
We present a crystallography chip enabling in situ room temperature crystallography at microfocus synchrotron beamlines and X-ray free-electron laser (X-FEL) sources. Compared to other in situ approaches, we observe extremely low background and high diffraction data quality. The chip design is robust and allows fast and efficient loading of thousands of small crystals. The ability to load a large number of protein crystals, at room temperature and with high efficiency, into prescribed positions enables high throughput automated serial crystallography with microfocus synchrotron beamlines. In addition, we demonstrate the application of this chip for femtosecond time-resolved serial crystallography at the Linac Coherent Light Source (LCLS, Menlo Park, California, USA). The chip concept enables multiple images to be acquired from each crystal, allowing differential detection of changes in diffraction intensities in order to obtain high signal-to-noise and fully exploit the time resolution capabilities of XFELs.