Wide-field lensing mass maps from Dark Energy Survey science verification data: 
Methodology and detailed analysis

Vikram, V.; Chang, C.; Jain, B.; Bacon, D.; Amara, A.; Becker, M. R.; Bernstein, G.; Bonnett, C.; Bridle, S.; Brout, D.; Busha, M.; Frieman, J.; Gaztanaga, E.; Hartley, W.; Jarvis, M.; Kacprzak, T.; Kovács, A.; Lahav, O.; Leistedt, B.; Lin, H.; Melchior, P.; Peiris, H.; Rozo, E.; Rykoff, E.; Sánchez, C.; Sheldon, E.; Troxel, M. A.; Wechsler, R.; Zuntz, J.; Abbott, T.; Abdalla, F. B.; Armstrong, R.; Banerji, M.; Bauer, A. H.; Benoit-Lévy, A.; Bertin, E.; Brooks, D.; Buckley-Geer, E.; Burke, D. L.; Capozzi, D.; Rosell, A. Carnero; Kind, M. Carrasco; Castander, F. J.; Crocce, M.; Cunha, C. E.; D’Andrea, C. B.; da Costa, L. N.; DePoy, D. L.; Desai, S.; Diehl, H. T.; Dietrich, J. P.; Estrada, J.; Evrard, A. E.; Neto, A. Fausti; Fernandez, E.; Flaugher, B.; Fosalba, P.; Gerdes, D.; Gruen, D.; Gruendl, R. A.; Honscheid, K.; James, D.; Kent, S.; Kuehn, K.; Kuropatkin, N.; Li, T. S.; Maia, M. A. G.; Makler, M.; March, M.; Marshall, J.; Martini, P.; Merritt, K. W.; Miller, C. J.; Miquel, R.; Neilsen, E.; Nichol, R. C.; Nord, B.; Ogando, R.; Plazas, A. A.; Romer, A. K.; Roodman, A.; Sanchez, E.; Scarpine, V.; Sevilla, I.; Smith, R. C.; Soares-Santos, M.; Sobreira, F.; Suchyta, E.; Swanson, M. E. C.; Tarle, G.; Thaler, J.; Thomas, D.; Walker, A. R.; Weller, J.

doi:10.1103/PhysRevD.92.022006

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Wide-field lensing mass maps from Dark Energy Survey science verification data: Methodology and detailed analysis

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Gruen, D.
Optical and Interpretative Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Weller, J.
Optical and Interpretative Astronomy, MPI for Extraterrestrial Physics, Max Planck Society;

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Vikram, V., Chang, C., Jain, B., Bacon, D., Amara, A., Becker, M., et al. (2015). Wide-field lensing mass maps from Dark Energy Survey science verification data: Methodology and detailed analysis. Physical Review D, 92(2): 022006, pp. 1-22. doi:10.1103/PhysRevD.92.022006.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-9692-B

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