Spectroscopy of single metallic nanoparticles using total internal reflection 
microscopy

Sonnichsen, C.; Geier, S.; Hecker, N. E.; von Plessen, G.; Feldmann, J.; Ditlbacher, H.; Lamprecht, B.; Krenn, J. R.; Aussenegg, F. R.; Chan, V. Z. H.; Spatz, Joachim P.; Moller, M.

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Spectroscopy of single metallic nanoparticles using total internal reflection microscopy

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Sonnichsen, C., Geier, S., Hecker, N. E., von Plessen, G., Feldmann, J., Ditlbacher, H., et al. (2000). Spectroscopy of single metallic nanoparticles using total internal reflection microscopy. Applied Physics Letters, 77(19), 2949-2951.

Cite as: https://hdl.handle.net/11858/00-001M-0000-002A-14CA-9

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