A Sensitive Method for Measuring Surface Recombination of Hydrogen Isotopes 
Implanted into Metals

Boergesen, P.; Scherzer, B.M.U.; Moeller, W.

Item

ITEM ACTIONSEXPORT

Add to Basket

Local TagsRelease HistoryDetailsSummary

Released

Journal Article

A Sensitive Method for Measuring Surface Recombination of Hydrogen Isotopes Implanted into Metals

MPS-Authors

/persons/resource/persons109974

Moeller, W.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

External Resource

No external resources are shared

Fulltext (restricted access)

There are currently no full texts shared for your IP range.

Fulltext (public)

There are no public fulltexts stored in PuRe

Supplementary Material (public)

There is no public supplementary material available

Citation

Boergesen, P., Scherzer, B., & Moeller, W. (1985). A Sensitive Method for Measuring Surface Recombination of Hydrogen Isotopes Implanted into Metals. Nuclear Instruments and Methods in Physics Research. B, 9, 33.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-A2FD-D

Abstract

There is no abstract available