High-Fluence He-Implantation in Ni Trapping, Re-Emission, and Surface 
Modification

Scherzer, B.M.U.; Ehrenberg, J.; Behrisch, R.

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High-Fluence He-Implantation in Ni Trapping, Re-Emission, and Surface Modification

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Behrisch, R.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Scherzer, B., Ehrenberg, J., & Behrisch, R. (1983). High-Fluence He-Implantation in Ni Trapping, Re-Emission, and Surface Modification. Radiation Effects, 78, 417.

Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-A44B-B

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