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Journal Article

Direct Comparison of Ion Scattering and Secondary Ion Emission as Tools for Analysis of Metal Surfaces

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Heiland,  W.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;
Experimental Plasma Physics 2 (E2), Max Planck Institute for Plasma Physics, Max Planck Society;

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Taglauer,  E.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Grundner, M., Heiland, W., & Taglauer, E. (1974). Direct Comparison of Ion Scattering and Secondary Ion Emission as Tools for Analysis of Metal Surfaces. Applied Physics, 4, 243-248.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-B449-3
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