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Depth-Profiling of Cu-Ni Sandwich Samples by Secondary Ion Mass Spectrometry

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Liebl,  H.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Hofer, W., & Liebl, H. (1975). Depth-Profiling of Cu-Ni Sandwich Samples by Secondary Ion Mass Spectrometry. Applied Physics, 8, 359-360.


Cite as: http://hdl.handle.net/11858/00-001M-0000-0028-B7FC-A
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