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Journal Article

An Electronic Aperture for In-Depth Analysis of Solids with an Ion Microprobe

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Liebl,  H.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Roos,  G.
Central Technical Service (ZTE), Max Planck Institute for Plasma Physics, Max Planck Society;

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Staudenmaier,  G.
Surface Science (OP), Max Planck Institute for Plasma Physics, Max Planck Society;

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Citation

Hofer, W., Liebl, H., Roos, G., & Staudenmaier, G. (1976). An Electronic Aperture for In-Depth Analysis of Solids with an Ion Microprobe. International Journal of Mass Spectrometry and Ion Physics, 19, 327-334.


Cite as: https://hdl.handle.net/11858/00-001M-0000-0028-B9A3-F
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